Start | Products | Accessories | Test Probes | PJP 464-IEC Fine-tipped spring-loaded probe for surface-mounted components and dense wiring paths -
PJP 464-IEC Fine-tipped spring-loaded probe for surface-mounted components and dense wiring paths -  Black
Videos

PJP 464-IEC Fine-tipped spring-loaded probe for surface-mounted components and dense wiring paths - Black

Art. nr: 70437
 
10 EUR
 
Quantity
 
 
 

Product description

Very fine mini spring loaded tips (0.75 mm retractable) avoid slippages.

Completely suitable for SMD technology and high density controls.

All tips fit out with protective cap in order to avoid short-circuits. Suitable for active circuits.

 

Damping (strength 1.5 Newton) Sharp (diameter 0.75 mm) Tip Probe Body w/ 4 mm Banana (female) Jack.

Electric: 600 V CAT II, reinforced insulation, pollution degree 2, 1 A.