The VIS 1700 simulator can simulate the voltage dips
and fluctuations occurring on the supply networks (AC and DC). Different operating modes are possible:
Short time interruptions 100 %:
Interruption of the supply voltage from the EUT from 100 % to 0 %. The supply network of the EUT can be interrupted in any phase position for a defined time (0.1 ms - 9980 ms). Rise and fall time: 1 - 5 µs.
Voltage dips with external step transformer:
Reduction of the supply voltage from the EUT from 100 % to X %. Dips to 40 %, 70 % or 80 % of the nominal voltage can be simulated at a certain phase angle and a time x. This test requires a second voltage source, which a step transformer with sufficient power fulfills.
For more information about the accessory VIS 740 Step transformator with rise and fall time: 1 - 5 µs, see the datasheet and users guide.
Voltage fluctuations with automatic ramp function (variation function):
Internal reduction of the supply voltage with adjustable ramps and adjustable test time. Fluctuation to an adjustable voltage (0 - 95 % of U1). The parameters for fall time, test time and recovery time (0.1 to 70 sec. each) can be set individually. For this purpose, it is not necessary to feed in a further voltage.
Inrush current measurement:
The inrush current can be measured at any phase position (0 - 360°) for each test object up to a maximum of 16 A rated current (AC).
For more information on the EMC Soft 11 accessory - control software for EMC test equipment, see additional documents.
